The Convergence of AI And UVM: Advanced Methodologies for the Verification of Complex Low-Power Semiconductor Architectures. International Journal of Advanced Artificial Intelligence Research, [S. l.], v. 2, n. 11, p. 12–22, 2025. DOI: 10.55640/. Disponível em: https://aimjournals.com/index.php/ijaair/article/view/345.. Acesso em: 14 nov. 2025.